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ESA Space Solutions BelgiumESA Space Solutions Belgium
ESA Space Solutions BelgiumESA Space Solutions Belgium
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Improved Schlieren method

Allowing for high resolution mapping

An industrial optical engineering firm from Belgium has developed and patented the phase-shifting Schlieren method, filling a niche in the range of optical measurement techniques. This submicron method almost reaches the resolution achieved by interferometric systems, but avoids their inherent limitations (cost, environment insulation, sensitivity & limited shape steepness). It has a variable sensitivity, both high in spatial (in-plane) and height (out-of-plane) resolution. At the same time, it does not suffer from vignetting, digitization effects or sample positioning; and it is auto-calibrated.

This method can be used for detecting surface shape, quality, defects and inhomogeneities of transparent objects, thin films, gas-liquid interfaces and reflective surfaces. Partnerships are welcomed, both for direct use or integration of the technology, and for dedicated application or development of the method into a product.

Advantages

The Schlieren method itself is not new, and is popular due to:

  • its relative ease of implementation,
  • its low cost,
  • its use of conventional optics and light sources,
  • its variable sensitivity to fit the object under study,
  • its robustness to vibrations (well adapted to industrial environment).

Combining Schlieren with phase-shifting methods leads to additional benefits:

  • It has an inherent high in-plane resolution, which only depends on the spatial resolution of the camera detector.
  • It provides a high out-of-plane resolution (0.002°), as phase-shifting provides a real measured gray values per camera pixel, without digitization or resolving effects limiting the resolution.
  • The method does not suffer from small vignetting.
  • The method creates large dynamic angular range, and thus the ability to characterize objects with large slopes.

Applications

The method is mature and has already been successfully applied to:

  • perform in-line quality control of ophthalmic lenses,
  • quantify shape and defects in glass spectacles,
  • investigate multi-layered computer displays,
  • visualize convection pockets at a gas-liquid surface,
  • identify transparent material inhomogeneities,
  • quantify flatness/polish of glass and mirrors.
  • Developer: Open Source Management
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